MTI  |  SKU: EQ-XRF-32-LD

Automatic 32-Sample XRF Scanning System for High Throughput Composition Analysis - EQ-XRF-32-LD

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Automatic 32-Sample XRF Scanning System for High Throughput Composition Analysis - EQ-XRF-32-LD

MTI

EQ-XRF-32-LD is high throughput 32-sample X-ray fluorescence (XRF) / energy dispersive spectrometer (EDS) system ( Made by Olympus ) for non-destructive composition analysis. The station integrates a handheld XRF spectrometer with XY stage, 32-sample station, and laptop remote control. It enables quick and easy composition analysis of samples (elements from Mg to Bi), with concentrations as low as 0.01%. The system automation provides 32-sample testing, analysis, and result output in one autorun with the push of a single button. It is an excellent tool for high throughput research and development of powder and bulk materials, for applications such as high-entropy alloys, novel magnetic materials, solid ceramic electrolyte materials, etc
SPECIFICATIONS:
Features
  • The high throughput XRF station consists of:
    • Handheld XRF spectrometer made by Olympus.
    • XRF spectrometer holder and triggering mechanism
    • XY stage system and its control box
    • 32-position transparent sample stage (no interference to XRF signal)
    • Laptop with pre-installed control and analysis software
    • Station cabinet with warning lights and lead glass for X-ray safety
  • The automatic operation improves efficiency, reduces operator-related error, and minimizes X-ray exposure
  • Fast, automatic XRF measurement and analysis of 32 samples (~20 min depending on the testing time), and automatic output of composition/spectrum data via a USB port
  • The XRF system can be upgraded with 1D line scan and 2D mapping scan features at the extra cost 
  • Please contact MTI for system customization, such as sample stage with different dimensions, integration of the station with a glove box, etc
Power Input
XRF Spectrometer

     
 
 
  • X-ray Source:
    • X-ray tube: 4 W Rh target X-ray tube (optional Ag, Au, or Ta target available)
    • Voltage: 40 kV max (50 kV option available)
    • Current: 200 ?A max
    • Spot size: 3 mm (with collimator) and 9 mm 
    • Window Material: Beryllium (Be)
    • Window guard: Kapton and Prolene window protection films
  • Detector:
    • SDD (Silicon drift detector): High energy resolution (165 eV FWHM) for general detection covering the whole element range
    • Detector size: 25 mm2 large area detector for high count rate
    • Window Material: Beryllium (Be)
  • Features:
    • An element library for alloy elements are pre-installed: Mg, Al, Si, P, S, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Pd, Ag, Cd, Sn, Sb, Hr, Ta, W, Re, Pb, Bi (Customized element library is available upon request)
    • Integrated CMOS camera for observing the measurement area on the sample surface
    • Built-in sample proximity sensor to close X-ray shutter if no sample is detected near the detector
    • USB / Bluetooth connection to a laptop for remote control and data output
XRF Holder & Trigger
  • A XRF spectrometer holder with trigger-pressing mechanism is integrated into the system for continuous, automatic measurement
  • The XRF measurement time can be controlled by setting the press-down time of the trigger mechanism
XY Sample Stage
  
  • Touch screen controlled XY stage for precise sample positioning and measurement repeatability
  • XRF measurement time, X- / Y- axis travel speed, sample selections can be configured on the control box touch screen
  • 32-sample transparent stage (no interference to XRF signal) for as-received arc melting samples (?10 g) (max sample size: 20 mm) is included.
  • The sample is supported by XRF transparent Prolene film for maximized XRF signal
                 
Station Cabinet
 
  • Station cabinet with warning lights and lead glass for X-ray operation safety
  • XY stage control box is integrated into the station cabinet
  • An optional high-accuracy digital Geiger counter/dosimeter can be mounted on the cabinet for monitoring the radiation level (Click the photo below)
          
XRF Control & Analysis
  • A laptop with pre-installed XRF control software and spectrum analysis software are included for XRF spectrometer remote control and data analysis
  • The control/analysis software is capable of 
    • Adjust measurement settings: X-ray voltage/current, testing time, spot size, measurement repeats
    • Real-time observation of measurement area on the sample surface using the integrated CMOS camera
    • Default element library for alloy elements: Mg, Al, Si, P, S, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Pd, Ag, Cd, Sn, Sb, Hr, Ta, W, Re, Pb, Bi
    • A customized element library (up to 40 elements) for ceramic analysis or other applications is available upon request
    • Fundamental parameters analysis, both qualitatively and quantitatively
    • Full correction on attenuation in air and absorption of window/window guard 
    • Auto-mode for continuous or repeated analysis
Options
  • The XRF system can be upgraded with 1D line scan and 2D mapping scan features at extra cost
  • Please contact MTI for system customization, such as sample stage with different dimensions, integration of the station with a glove box, etc
Net Weight
  • 120 kg
Compliance
   
  • XRF spectrometer: CE, FCC (USA), ICES-001 (Canada) approval 
  • EQ-XRF-32-LD is CE certified.
Warranty
  • One-year limited warranty with lifetime support
Dimension
  • 820 נ680 נ1200 mm (L × D × H)  (Depth with door open: 1050mm)
Shipping Weight & Dimensions
  • 440 lbs
  • 48" x 40" x 56"
Operation Video
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